Numerical modelling of electrostatic force microscopes considering charge and dielectric constant
نویسندگان
چکیده
منابع مشابه
Numerical study of the lateral resolution in electrostatic force microscopy for dielectric samples.
We present a study of the lateral resolution in electrostatic force microscopy for dielectric samples in both force and gradient modes. Whereas previous studies have reported expressions for metallic surfaces having potential heterogeneities (Kelvin probe force microscopy), in this work we take into account the presence of a dielectric medium. We introduce a definition of the lateral resolution...
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R. Arinero, C. Riedel, G. A. Schwartz, G. Lévêque, A. Alegría, Ph. Tordjeman, N. E. Israeloff, M. Ramonda and J. Colmenero 1 IES, UMR CNRS 5214, Université Montpellier II, CC 083, Place E. Bataillon, 34095 Montpellier Cedex, France 2 Donostia International Physics Center (DIPC), Paseo Manuel de Lardizábal 4, 20018 San Sebastián, Spain. 3 Departamento de Física de Materiales UPV/EHU, Facultad de...
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ژورنال
عنوان ژورنال: COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
سال: 2009
ISSN: 0332-1649
DOI: 10.1108/03321640910918913